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Insight Global

Senior Test Engineer

Burlington, ON, Canada

$110,000 to $130,000 CAD / year · Full-time

Within 25 km of Oakville · About 13.5 km from the city centre

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Job details

Pay: $110,000 to $130,000 CAD / year
Job type: Full-time
Apply by: Nov 4, 2026
Experience: 6+ years of semiconductor test engineering experience
Posted: Oct 5, 2026

Original job description

Position: Senior NPI Test Engineer

Location: Burlington, Ontario (Hybrid)

Role Type: Permanent

Pay Rate: $110,000 - $130,000 CAD base + RSUs, bonuses and benefits

Required Skills & Experience

BS in Electrical/Computer Engineering (or related)
6+ years of semiconductor test engineering experience
Experience owning NPI programs (concept → production)
Hands-on experience with Advantest V93000 (93K) / SmarTest 7/8, Teradyne uFlex/UtraFlex, Cohu, OR Chroma
Hands-on experience with analog/mixed-signal ICs.
Knowledge of DFT (BIST, scan, boundary scan)

Nice to Have Skills & Experience

RF experience
High-speed (signal integrity, jitter, BER, >40GHz)
SerDes / CDR / high-speed I/O (200Gbps+)
Advantest 93K instruments (PS1600/PS3600, Wave Scale RF)
Teradyne uFlex (HSD200, DC30) + capacitive sensing
Automotive (AEC-Q100) knowledge
PCB design (Cadence, Altium), wafer-level test, probe cards
Data analytics / ML for yield improvement

Job Description

Insight Global is seeking a Senior NPI Test Engineer to serve as the technical authority and strategic leader for new product introduction test development in our mixed-signal product portfolio. This role demands a proven innovator who can architect comprehensive test solutions spanning from early silicon validation through high-volume production. The ideal candidate will drive testability standards across the organization, lead complex multi-disciplinary projects, and deliver breakthrough test methodologies that enable next-generation high-speed communication products operating at 200Gbps and beyond.

Key Responsibilities:

Develop/debug ATE test programs on Advantest V93000 (93K)
Support test development on Teradyne uFlex for analog/sensing products
Review test hardware designs (load boards, probe interfaces)
Perform hands-on lab work: bring-up, silicon debug, and production release
Partner with design teams on DFT and testability requirements
Support characterization, correlation, and test readiness reviews
Transfer solutions to OSAT/manufacturing sites and drive yield improvements
Mentor junior engineers and build reusable test IP/documentation

Disclaimers:

Artificial intelligence tools are used to assist in screening and assessing applicants for this position.
This position is an existing vacancy.

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More about this job

Responsibilities

Develop and debug ATE test programs for mixed-signal products, perform hands-on silicon bring-up and debug, review test hardware, and support characterization and production release. Lead NPI test development from early validation through high-volume manufacturing, coordinate with design and manufacturing teams, improve yield, and mentor engineers while building reusable test documentation and IP.

Requirements

Requires a bachelor's degree in Electrical or Computer Engineering or a related field, at least six years of semiconductor test engineering experience, and ownership of NPI programs from concept through production. Candidates need hands-on experience with ATE platforms such as Advantest V93000 or Teradyne uFlex and analog/mixed-signal ICs, plus knowledge of DFT; RF, high-speed interfaces, automotive qualification, PCB design, and yield analytics are advantageous.

Skills

Semiconductor Test Engineering
New Product Introduction
Advantest V93000
SmarTest 7/8
Teradyne uFlex/UltraFlex
Analog/Mixed-Signal ICs
Design for Test
ATE Test Program Development
Silicon Validation and Debug
Test Hardware Design
Characterization and Correlation
Yield Improvement
High-Speed Communications
SerDes/CDR
RF Testing
DFT (BIST, Scan, Boundary Scan)

Benefits

Restricted Stock Units
Bonuses
Benefits

Visa sponsorship

Not detected in the job text

Keywords

Semiconductor
New Product Introduction
Test Engineering
ATE
Advantest V93000
SmarTest 7/8
Teradyne uFlex
UltraFlex
Cohu
Chroma
Analog/Mixed-Signal ICs
Design for Test
BIST
Scan Testing
Boundary Scan
RF
Signal Integrity
Jitter
BER
SerDes
CDR
High-Speed I/O
AEC-Q100
Cadence
Altium
Wafer-Level Test
Probe Cards
Yield Improvement
OSAT
Machine Learning

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